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Eliminating Critical Software Errors in Embedded Code

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Increasing software content and complexity in today’s embedded devices amplifies the risk of failure and complicates the process of achieving high confidence in safety and reliability. Traditional software testing methods are limited in scope and static analysis based testing produce high rates of false positives. Formal methods based abstract interpretation is quickly becoming the solution of choice, because it proves the absence of a defined set of run-time errors in code. 

Software and quality engineering teams improve the overall reliability of software by verifying code to be free of run-time errors such as:
•  under/overflows
•  out-of-bounds array index
•  illegal pointer de-referencing
•  other run-time errors 

In this webinar learn how these new techniques can be applied to the development of critical embedded applications where software quality is at stake.

About the Presenter: Jay Abraham is currently Technical Manager at MathWorks. His area of expertise is in software tools for the verification of critical embedded applications.  He has 20 years software and hardware design experience. Jay began his career as a microprocessor designer at IBM followed by engineering and design positions at hardware, software tools, and embedded operating systems companies such as Wind River Systems. He has held chair memberships in IEEE standards committees and has presented at prestigious conferences such as the Design Automation Conference and Embedded Systems Conference.  Jay has a MS in Computer Engineering from Syracuse University and a BS in Electrical Engineering from Boston University.

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Recorded: 23 feb 2010